TR-PROBE THz-Raman™ Probe
Model：TR-PROBE
Overview
TR-PROBE THz-Raman™ Probe extends Raman into the THz/low-frequency domain (down to ~10cm⁻¹) with ultra-narrowband notch and ASE clean-up filters. Single wavelength 532/785/830nm or dual 830+638nm excitation, simultaneous Stokes & Anti-Stokes, with interchangeable sampling accessories for real-time in-situ analysis without sample preparation.Description
Overview
TR-PROBE THz-Raman™ Spectroscopy Systems expand traditional Raman spectroscopy into the Terahertz/low-frequency domain, capturing the same range of energy transitions as terahertz spectroscopy while retaining the ability to measure the Raman "chemical fingerprint" region. With ultra-narrowband notch and ASE clean-up filters, built-in thermal compensation, and a variety of sample accessories, these systems offer robust and stable performance with no special sample preparation, enabling real-time, in-situ analysis of material processes.
Features
- THz/low-frequency measurement down to ~10cm⁻¹; spectral range -770~+3120cm⁻¹ (785nm)
- Simultaneous Stokes and anti-Stokes signals - improved SNR with inherent calibration reference
- Excitation wavelengths 532/785/830nm single or 830+638nm dual; up to 300mW
- Dual-polarization variant for simultaneous measurement in both polarizations
- Fiber coupled output for interfacing with a wide range of spectrometers
- Interchangeable sample accessories: TR-ACC-SPEC, TR-ACC-PRTIP, TR-ACC-MICRO, TR-ACC-VIALKIT, TR-WP
- No special sample preparation needed; real-time in-situ analysis
Key Applications
- Process monitoring of phase transformations and solid-state chemistry
- In-line crystallinity monitoring for amorphous solid dispersions (ASD)
- Polymorphism differentiation and salt screening
- Crystallinity meter - monitoring and quantifying degree of crystallinity
- Co-crystal formation characterization
- Nanomaterials - thickness and orientation of 2D materials (TMDs)
- Structural characterization of polymers
【Contact】
17317958112
Specifications
| Excitation Wavelength | Single: 532 / 785 / 830nm; Dual: 830+638nm |
| Power at Sample Port | 75mW (532 single-mode); 50mW (830 single-mode); 300mW (multi-mode); 100mW (638 multi-mode)+300mW (830 multi-mode, dual) |
| Spectral Range (785nm) | 740~1040nm; -770~+3120cm⁻¹ |
| Spectral Range (830nm) | -1460~+2430cm⁻¹ |
| Stray Light (Monochromatic Input) | <0.03% (at ±40nm from peak) |
| Weight | 1.6kg (TR-PROBE); 3.5kg (CleanLine); 6.9kg (Spectrograph) |
| Dimensions (L×W×H) | 215.9×76.2×58.4mm (probe head only) |
| Sampling Accessories | TR-ACC-SPEC / TR-ACC-PRTIP / TR-ACC-MICRO / TR-ACC-VIALKIT / TR-WP |
Technical Data
TR-PROBE THz-Raman™ 探头 规格参数表
| 项目 | TR-PROBE | CleanLine | Spectrograph |
|---|---|---|---|
| 激发波长 | 单波长 532 / 785 / 830nm；双波长 830+638nm | ||
| 样品口功率 | 75mW（532 单模） 50mW（830 单模） 300mW（多模） | 100mW（638nm 多模）+300mW（830nm 多模，双波长） | |
| 光谱范围（785nm） | 740~1040nm | -770~+3120cm⁻¹ | |
| 光谱范围（830nm） | -1460~+2430cm⁻¹ | ||
| 杂散光（单色输入） | <0.03%（距峰值 ±40nm） | ||
| 重量 | 1.6kg | 3.5kg | 6.9kg |
| 外形尺寸（L×W×H） | 215.9×76.2×58.4mm | 229×199×89mm | 266×155×162mm |
应用实例：卡马西平晶型 1 与晶型 3 拉曼光谱（785nm 激发），低波数区晶型差异清晰可辨
Outline Drawing（外形尺寸，单位 mm；BEAM HEIGHT 30mm，45° 接口，M4×0.7 安装螺纹）