M² Beam Quality Measurement System

Model：CN0310VIS-M2-B

Overview

M² beam quality measurement system: integrated design with high-precision motorised rail and high-resolution beam profiler (2448×2448 pixels), one-click measurement of M² factor, divergence angle, focus diameter, waist position and Rayleigh length via dedicated software; overall accuracy within ±5%, for cw and pulsed lasers, spectral range 340-1100nm.

Description

【Overview】

The M² beam quality measurement system features an integrated design with a high-precision motorised rail and high-resolution beam profiler, measuring M² factor, divergence, focus diameter, waist position, Rayleigh length and other beam parameters via dedicated software.

【Key Features】

(1) Overall accuracy within ±5%;

(2) For cw and pulsed laser beam quality;

(3) Spectral range 340-1100nm;

(4) Detection accuracy ≤5%;

(5) Simple, fast one-click measurement;

(6) Short delivery, fast after-sales, cost-effective alternative to imported beam analysers.

【Typical Applications】

Advanced manufacturing, scientific research, medicine and life sciences, defence and aerospace, emerging technologies.

Specifications

Model	CN0310VIS-M2-B
Test wavelength	340-1100nm
M² range	1-50
Max input beam	≤5mm@355nm; ≤7.5mm@532nm; ≤10mm@1064nm (1/e²)
Detection accuracy	≤5%
Focus position accuracy	±10%
Max resolution	2448×2448 pixels
Power range	cw: 1μW-10W/cm²; pulsed: 10μJ-10mJ/cm²
Attenuators	OD 0.5 / 1 / 1.5 / 2 / 3 / 4
Interface	USB 3.0
Travel	200mm (double optical path), repeatability ±5μm
Controller	RS232, dual-axis
Weight	<15kg
Dimensions	500×250×175mm (ref.)

Technical Data

M² 测量系统分析软件界面