Sunpump

Sample Testing Service

Model:SPFW
Sample Testing Service
Sample Testing Service

Overview

Sunpump Sample Testing Service Center provides one-stop sample testing and technical measurement services based on our in-house platforms including laser ultrasound (LUS), ultrafast transient spectroscopy, LBIC, low-wavenumber Raman, LIBS and micro-imaging spectroscopy. Both courier-sample and on-site testing supported. Contact us for testing proposals and quotations.

Description

1. Service Overview

With nearly 20 years of experience in laser and optics, Sunpump offers professional sample testing services based on our own platforms: laser ultrasound, LBIC, ultrafast transient absorption/fluorescence spectroscopy, low-wavenumber Raman, LIBS and micro-imaging spectroscopy. Customized testing plans are provided per customer requirement, with complete data and analysis delivered.

2. Testing Capabilities

Laser Ultrasound: non-contact NDT for internal defects, thickness, stress and coating.

LBIC: light-beam-induced-current imaging for photovoltaic/semiconductor characterization.

Ultrafast Transient Absorption: femtosecond time-resolved spectroscopy for carrier dynamics and excited-state studies.

Ultrafast Transient Fluorescence: time-resolved fluorescence lifetime measurement.

Low-wavenumber Raman: down to 5 cm⁻¹ with ultra-narrowband notch filters.

LIBS: rapid elemental analysis for solids and liquids.

Micro-imaging Spectroscopy: micro-region composition and structure analysis.

3. Service Process

1) Requirements discussion; 2) Sample delivery; 3) Testing and data acquisition; 4) Report with spectra and analysis.

4. Applications

Materials characterization & NDT; semiconductor & PV device evaluation; new energy materials; bio/chemical samples; cultural heritage; industrial QC.

5. Contact

Phone: +86 17317958112 · Email: service@sunpump.com.cn. We reply within 1 working day with a free testing proposal.

Specifications

Laser UltrasoundNon-contact NDT: defect/thickness/stress/coating
LBICPhoto-response imaging for PV/semiconductor defects
Transient AbsorptionFemtosecond pump-probe: carrier/excited-state dynamics
Transient FluorescenceTime-resolved fluorescence: ps–ns lifetime
Low-wavenumber RamanDown to 5 cm⁻¹: lattice vibration/phase transition
LIBSRapid elemental analysis: solids/liquids
Micro-spectroscopyMicro-region composition analysis

Technical Data

Platforms & Technical Notes

Laser ultrasound: non-contact, no couplant needed, for harsh surfaces and complex geometries. LBIC: micron-scale spatial resolution defect imaging. TAS: sub-picosecond time resolution pump-probe. Transient fluorescence: ps–ns lifetime. Low-wavenumber Raman: 5 cm⁻¹ cutoff via VBG notch filters. LIBS: spectral elemental analysis. Micro-spectroscopy: micro-region mapping.